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A new cluster-ion-beam source for secondary ion mass spectrometry (SIMS) using the electrospray of a pure ionic liquid under high vacuum

✍ Scribed by Yukio Fujiwara; Naoaki Saito; Hidehiko Nonaka; Taisuke Nakanaga; Shingo Ichimura

Book ID: 108224722
Publisher: Elsevier Science
Year: 2010
Tongue: English
Weight: 421 KB
Volume: 268
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2010.02.097

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