A New Charge-Pumping Technique for a Double-Gated SOI MOSFET Using Pulsed Drain Current Transients

✍ Scribed by Sungho Kim; Sung-Jin Choi; Dong-Il Moon; Yang-Kyu Choi

• Book ID: 114620763
• Publisher: IEEE
• Year: 2012
• Tongue: English
• Weight: 585 KB
• Volume: 59
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2011.2171489