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A new beam profile monitor and time of flight system for CologneAMS

✍ Scribed by G. Pascovici; A. Dewald; S. Heinze; L. Fink; C. Müller-Gatermann; M. Schiffer; C. Feuerstein; M. Pfeiffer; J. Jolie; S. Thiel; K.O. Zell; O. Arnopolina; F. von Blanckenburg

Book ID
119333397
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
930 KB
Volume
294
Category
Article
ISSN
0168-583X

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A new focused ion beam optical system that uses a liquid metal ion source was designed for a new secondary ion time-of-flight mass spectrometry instrument. This optical system consists mainly of two electrostatic lenses. The axial performance of the system was calculated to decide the design values