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A new approach to the simulation of the coupled point defects and impurity diffusion

✍ Scribed by Rorris, E.; O'Brien, R.R.; Morehead, F.F.; Lever, R.F.; Peng, J.P.; Srinivasan, G.R.

Book ID: 119778157
Publisher: IEEE
Year: 1990
Tongue: English
Weight: 965 KB
Volume: 9
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.62735

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