BAST: BIST-aided scan test. A new method
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Takashi Aikyo; Takahisa Hiraide; Michiaki Emori
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Article
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2007
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John Wiley and Sons
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English
⚖ 480 KB
## Abstract It is common to use ATPG of scan‐based design for high fault coverage in LSI testing. However, significant increases in test cost arise with increasing design complexity. Recent strategies for test cost reduction combine ATPG and BIST techniques. Unfortunately, these strategies have ser