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A neural approach to study the scaling capability of the undoped Double-Gate and cylindrical Gate All Around MOSFETs

โœ Scribed by F. Djeffal; M.A. Abdi; Z. Dibi; M. Chahdi; A. Benhaya


Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
648 KB
Volume
147
Category
Article
ISSN
0921-5107

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