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A Negative Resistance Mechanism Arising from Space Charge Injection in Semiconductors

✍ Scribed by R. H. Tredgold; G. G. Roberts

Book ID: 104538301
Publisher: John Wiley and Sons
Year: 1969
Tongue: English
Weight: 102 KB
Volume: 31
Category: Article
ISSN: 0370-1972
DOI: 10.1002/pssb.19690310169

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## Abstract The frequency and temperature dependence of the dielectric constant of SrTiO~3~ (STO) thin‐film capacitors in multilayer structures of YBa~2~Cu~3~O~7–__δ__~/SrTiO~3~/YBa~2~Cu~3~O~7–__δ__~ films were measured over the frequency range 100 to 10^6^ Hz at 2–300 K. In a 750‐nm‐thick STO film