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A multi-section technique for the electroabsorption measurements in waveguide semiconductor electroabsorption modulators

โœ Scribed by Jain, M.; Ironside, C.N.


Book ID
117812543
Publisher
The Institution of Engineering and Technology
Year
2007
Tongue
English
Weight
210 KB
Volume
1
Category
Article
ISSN
1751-8768

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The absorption properties and the refractiยจe index change of an electroabsorption modulator were determined directly in the waยจe-guide configuration by eยจaluation of the modulation depth and the shift of FabryแސPerot modes. The shift direction indicates the sign of the chirp parameter. Chirp compensa