๐”– Bobbio Scriptorium
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A multi-sample, multi-wavelength, multi-angle investigation of the interface layer between silicon and thermally grown silicon dioxide

โœ Scribed by C.M. Herzinger; B. Johs; W.A. McGahan; W. Paulson


Book ID
114086325
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
256 KB
Volume
313-314
Category
Article
ISSN
0040-6090

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