Characterisation of Ni–Ti thin films pro
✍
N. Stanford; S.W. Huang; D. Dunne
📂
Article
📅
2008
🏛
Elsevier Science
🌐
English
⚖ 824 KB
Ti-49.5 at%Ni thin films have been formed by deposition onto Si and glass substrates using a filtered arc deposition system (FADS). The films deposited on glass were composed of nanocrystalline parent phase grains contained within an amorphous matrix. The films deposited onto silicon were crystallin