๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

A model of an optical roughness-measuring instrument

โœ Scribed by Aaron B. Kiely; Thomas R. Lettieri; Theodore V. Vorburger

Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
218 KB
Volume
32
Category
Article
ISSN
0890-6955

No coin nor oath required. For personal study only.

โœฆ Synopsis

SUm~AR%

We havE~ developed a nonlinear model of a commercial optical instrument for measuring the root-mean-square slopes of rough surfaces.

The model improves upon previous ones in that it accounts for certain instrumental factors which affect the optical roughness measurements.

๐Ÿ“œ SIMILAR VOLUMES

A new instrument for measuring stress in
A new instrument for measuring stress in an electrodeposit
โœ R.N. O'Brien ๐Ÿ“‚ Article ๐Ÿ“… 1990 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 201 KB

A Michelson interferometer is modified so that one of the mirrors attached to an arm (that is also a vertical cathode of a minicell) moves several wave-lengths of HeNe laser light as the strain in an electrodepoeit increases with thickness of copper deposited on the stainless steel arm.