A new instrument for measuring stress in an electrodeposit

✍ Scribed by R.N. O'Brien

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 201 KB
• Volume: 35
• Category: Article
• ISSN: 0013-4686
• DOI: 10.1016/0013-4686(90)87111-e

✦ Synopsis

A Michelson interferometer is modified so that one of the mirrors attached to an arm (that is also a vertical cathode of a minicell) moves several wave-lengths of HeNe laser light as the strain in an electrodepoeit increases with thickness of copper deposited on the stainless steel arm.