𝔖 Bobbio Scriptorium
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A method of test-suite reduction for regression integration testing

✍ Scribed by D. Yu. Kichigin


Book ID
110190952
Publisher
SP MAIK Nauka/Interperiodica
Year
2009
Tongue
English
Weight
199 KB
Volume
35
Category
Article
ISSN
0361-7688

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## Abstract It is common to use ATPG of scan‐based design for high fault coverage in LSI testing. However, significant increases in test cost arise with increasing design complexity. Recent strategies for test cost reduction combine ATPG and BIST techniques. Unfortunately, these strategies have ser