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A method of measuring the dielectric functions of thin films by the excitation of SPW in multi-layer system

✍ Scribed by T.M. Hsu; C.C. Chang; K.C. Lee

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A method of measuring the dielectric fun

✍ T.M. Hsu; C.C. Chang; K.C. Lee 📂 Article 📅 1984 🏛 Elsevier Science ⚖ 54 KB

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✍ Leclerc, Gervais ;Yelon, Arthur 📂 Article 📅 1984 🏛 The Optical Society 🌐 English ⚖ 300 KB

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✍ Waseda, A.; Fujii, K.; Taketoshi, N. 📂 Article 📅 2005 🏛 IEEE 🌐 English ⚖ 241 KB

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✍ V. A. Shvets; M. V. Yakushev 📂 Article 📅 2002 🏛 SP MAIK Nauka/Interperiodica 🌐 English ⚖ 62 KB

Evaluation of elastic moduli in thin-fil

✍ R. Whiting; M.A. Angadi; S. Tripathi 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 322 KB