✦ LIBER ✦

A method of detecting the nature of IC defects

✍ Scribed by M.J. Patyra; J. Zabrodzki

Book ID: 104157651
Publisher: Elsevier Science
Year: 1988
Tongue: English
Weight: 300 KB
Volume: 19
Category: Article
ISSN: 0026-2692
DOI: 10.1016/s0026-2692(88)80053-3

No coin nor oath required. For personal study only.

✦ Synopsis

Chip failures can be caused by point or parametric defects. The method shown is for classifying the failed chips against the two mentioned defects. The concept of an acceptibility region (Schmoo-plots) is used.

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