A method of detecting the nature of IC d
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M.J. Patyra; J. Zabrodzki
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Article
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1988
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Elsevier Science
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English
โ 300 KB
Chip failures can be caused by point or parametric defects. The method shown is for classifying the failed chips against the two mentioned defects. The concept of an acceptibility region (Schmoo-plots) is used.