A method of alignment for convergent beam diffraction in TEM mode for a JEM-100C electron microscope

✍ Scribed by M.J. Witcomb

• Publisher: Elsevier Science
• Year: 1982
• Tongue: English
• Weight: 577 KB
• Volume: 7
• Category: Article
• ISSN: 0304-3991
• DOI: 10.1016/0304-3991(82)90259-5