A method for determining foil thicknesses in TEM by using convergent beam electron diffraction under weak beam conditions

✍ Scribed by K.Z. Botros

• Publisher: Elsevier Science
• Year: 1995
• Tongue: English
• Weight: 523 KB
• Volume: 26
• Category: Article
• ISSN: 0968-4328
• DOI: 10.1016/0968-4328(96)88341-7