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A method for the estimation of surface diffusivity in the absence of film mass transfer resistance

โœ Scribed by Cho Lan-T'ai; Huang Ting-Chia

Book ID
107941814
Publisher
Elsevier Science
Year
1990
Weight
555 KB
Volume
43
Category
Article
ISSN
0300-9467

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Mott-Schottky (M-S) analysis in conjunction with the Point Defect Model (PDM) for passive films, we have determined the oxygen vacancy diffusion coefficient in the WO,\_, passive film formed on tungsten in phosphoric acid (pH = 0.96) solution at ambient temperature. The value obtained for Do is in t