Two experimental methods of determining the lumped series resistance of silicon solar cells are investigated. Both methods are based on the solution of the basic solar cell equation in conjunction with actual data taken from a single current-voltage (I-V) output curve. The assumption of a constant d
โฆ LIBER โฆ
A method for the direct measurement of the solar cell junction ideality factor
โ Scribed by Jia Quanxi; Liu Enke
- Publisher
- Elsevier Science
- Year
- 1987
- Weight
- 298 KB
- Volume
- 22
- Category
- Article
- ISSN
- 0379-6787
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The sensitic1ity of car ity Q-factor measurements in the cauity perturbation method can be improL5ed by using the differential averaging technique. The complex pemiitthity of low-loss dielectric samples are accurately obtained by eualuating the differential aueragng L'ahes among the original and per