โ Scribed by M.A. Hamdy; R.L. Call
No coin nor oath required. For personal study only.
Two experimental methods of determining the lumped series resistance of silicon solar cells are investigated. Both methods are based on the solution of the basic solar cell equation in conjunction with actual data taken from a single current-voltage (I-V) output curve. The assumption of a constant diode ideality factor along the entire I-V output characteristic is common in the derivation of both methods. It is shown that this assumption is inaccurate at normal intensities and can lead to erroneous results. It is evident that both methods are useful over only a limited range of solar cell operation and are accurate only for cells operating under very high illumination conditions where it is appropriate to assume that the diode ideality factor is constant at unity along the entire I-V curve.
๐ SIMILAR VOLUMES
About 20 methods of determining the solar cell series resistance R~ are reviewed. Their differences lie principally in: (i) experimental conditions (darkness or illumination, flash or constant illumination, static or dynamic mode, temperature conditions, frequential or non-frequential regime); (ii)