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A MEMS Electron Impact ion Source Integrated in a Micro-time-of-flight Mass Spectrometer

✍ Scribed by Tassetti, Charles-Marie; Duraffourg, Laurent; Danel, Jean-Sébastien; Peyssonneaux, Olivier; Progent, Frédéric; Machuron-Mandard, Xavier

Book ID: 122433932
Publisher: Elsevier
Year: 2012
Tongue: English
Weight: 750 KB
Volume: 47
Category: Article
ISSN: 1877-7058
DOI: 10.1016/j.proeng.2012.09.203

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