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A measurement fixture suitable for measuring substrate noise in the UWB frequency band

✍ Scribed by Ming Shen; Tian Tong; Jan H. Mikkelsen; Torben Larsen

Book ID: 106342498
Publisher: Springer
Year: 2008
Tongue: English
Weight: 354 KB
Volume: 58
Category: Article
ISSN: 0925-1030
DOI: 10.1007/s10470-008-9181-x

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