Wideband on-wafer noise measurement setup for noise characterization of active devices in the low VHF band

✍ Scribed by Roux, J.-P.; Escotte, L.; Plana, R.; Graffeuil, J.

• Book ID: 114543920
• Publisher: IEEE
• Year: 1997
• Tongue: English
• Weight: 634 KB
• Volume: 46
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/19.676720