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A Laboratory-Scale Synthesis of High-Purity AsF5 by Direct Fluorination of AsF3.

โœ Scribed by Adel A. A. Emara; John F. Lehmann; Gary J. Schrobilgen


Publisher
John Wiley and Sons
Year
2006
Weight
9 KB
Volume
37
Category
Article
ISSN
0931-7597

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โœ Kazuhiko Omote ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 301 KB

A new diffractometer was developed for measuring in-plane diffraction by employing an advanced parabolic multilayer and a rotating anode x-ray generator. By means of the diffractometer, the in-plane Co(002) diffraction peak and its lateral anisotropy was successfully observed in cobalt thin films of