Direct observation of in-plane texture in cobalt recording media by means of a laboratory-scale x-ray diffractometer

✍ Scribed by Kazuhiko Omote

• Publisher: John Wiley and Sons
• Year: 1999
• Tongue: English
• Weight: 301 KB
• Volume: 28
• Category: Article
• ISSN: 0049-8246
• DOI: 10.1002/(sici)1097-4539(199911/12)28:6<440::aid-xrs389>3.0.co;2-b

✦ Synopsis

A new diffractometer was developed for measuring in-plane diffraction by employing an advanced parabolic multilayer and a rotating anode x-ray generator. By means of the diffractometer, the in-plane Co(002) diffraction peak and its lateral anisotropy was successfully observed in cobalt thin films of magnetic recording media, which had so far been difficult to observe with a conventional q/2q diffractometer. In-plane diffraction is useful for analyzing such a lateral structure of thin films. It was possible to estimate lattice constants, crystallite size and the texture of the crystallites of cobalt thin films from the observed in-plane diffraction data. It was found that the magnetic properties of these disks had a close relationship with the crystallographic structure of cobalt films obtained by the present in-plane diffraction.