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A hot probe setup for the measurement of Seebeck coefficient of thin wires and thin films using integral method

✍ Scribed by Sarath Kumar, S. R.; Kasiviswanathan, S.


Book ID
120927610
Publisher
American Institute of Physics
Year
2008
Tongue
English
Weight
434 KB
Volume
79
Category
Article
ISSN
0034-6748

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