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A high-speed silicon photoconductive switch

✍ Scribed by Tungxi Wu; Baoheng Shang; André Vander Vorst


Publisher
John Wiley and Sons
Year
1996
Tongue
English
Weight
338 KB
Volume
11
Category
Article
ISSN
0895-2477

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✦ Synopsis


REF 0 . 0 Un i t r 5 0 . 0 mUnitr/ 5 0 . 0 mUnitt/ 15.802 mLI. START 0.045000000 GHz STOP 18. 045000000 GHz Figure 4 Measured and de-embedded line reflection coefficient s2 1 LINEAR s;! 1 L REF 1 . 0 U n i t s REF 0 . 0 CONCLUSION

A simple and accurate method for de-embedding the scattering parameters of a noncoaxial microwave device using a time-domain technique has been described. The accuracy of the method has been verified experimentally. No additional calibration standards are necessary and the number of microstrip contacts is reduced, which allows better precision. Furthermore, no data concerning the length of the microstrip lines or reflects are needed and the complete test fixture is simple to realize.


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