A high-sensitivity double-beam triple-crystal X-ray spectrometer for lattice parameter and topographic measurements

✍ Scribed by Buschert, R. C. ;Pace, S. ;Inzaghi, D. ;Merlini, A. E.

• Book ID: 114499150
• Publisher: International Union of Crystallography
• Year: 1980
• Tongue: English
• Weight: 843 KB
• Volume: 13
• Category: Article
• ISSN: 0021-8898
• DOI: 10.1107/s0021889880011946