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): A high-resolution x-ray diffraction study

✍ Scribed by Zhang, Qiang; Wang, Wenjie; Kim, Jong-Woo; Hansen, Benjamin; Ni, Ni; Bud'ko, Sergey L.; Canfield, Paul C.; McQueeney, Robert J.; Vaknin, David

Book ID
120038076
Publisher
The American Physical Society
Year
2013
Tongue
English
Weight
476 KB
Volume
87
Category
Article
ISSN
1098-0121

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High-resolution X-ray diffraction study
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## Abstract We report results of X‐ray investigations of tellurium‐doped GaAs~1–__x__~ P~__x__~ (with 0.07 ≀ __x__ ≀ 0.20) single crystals, conducted in order to support finding proper growth parameters which would yield a material of sufficient homogeneity of the lattice parameter for prospective