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A high P-T single-crystal X-ray diffraction study of thermoelasticity of MgSiO3orthoenstatite

โœ Scribed by Yusheng Zhao; David Schiferl; Thomas J. Shankland


Publisher
Springer-Verlag
Year
1995
Tongue
English
Weight
611 KB
Volume
22
Category
Article
ISSN
0342-1791

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X-ray diffraction study of a Bi4Ge3O12 c
โœ T.I. Milenov; P.M. Rafailov; R. Petrova; Yu.F. Kargin; M.M. Gospodinov ๐Ÿ“‚ Article ๐Ÿ“… 2007 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 857 KB

A Czochralski grown Bi 4 Ge 3 O 12 crystal plate of (BGO) was examined by several X-ray diffraction methods. The crystal structure, lattice parameter and the atomic positions were determined by single crystal X-ray diffractometry. The X-ray diffraction double crystal traverse topography (XRDT) image