𝔖 Bobbio Scriptorium
✦   LIBER   ✦

A helium cryostat for an x-ray diffraction camera for structure studies

✍ Scribed by A.A. Boiko; V.A. Kucheryavyi; A.I. Prokhvatilov


Publisher
Elsevier Science
Year
1973
Tongue
English
Weight
316 KB
Volume
13
Category
Article
ISSN
0011-2275

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


An instrument for the X-ray diffraction
✍ G.W.D. Briggs πŸ“‚ Article πŸ“… 1959 πŸ› Elsevier Science 🌐 English βš– 184 KB

An easily constructed reciprocating device for the X-ray examination of working electrodes is described, and an example is given of its application to the study of electrodeposited layers. RCsum&Un dispositif facile ii assembler permet d'obtenir in situ les intensitks relatives des diagrammes de di

An β€œacid” structure for polyriboguanylic
✍ Steven B. Zimmerman πŸ“‚ Article πŸ“… 1975 πŸ› Wiley (John Wiley & Sons) 🌐 English βš– 127 KB πŸ‘ 1 views

## A n "Acid" Structure for Polyriboguanylic Acid Observed b y X-Kuy Diffraction We report here 1 he application to polyrihoguanylic acid (poly rC;) of a techriiyue used to form solids nit h partial inolecular orientat ion by freairig of acidic. soli~tions.~ The freezing casts the pol>-mer inoleri

The use of x-ray diffraction under stres
✍ I. Boukal πŸ“‚ Article πŸ“… 1970 πŸ› Elsevier Science 🌐 English βš– 365 KB

The influences of compression and tension on the diffraction angle 20 of the principal amorphous X-ray diffraction maximum of bisphenol A polycarbonate have been measured as well as the change of the lattice constant of crystalline polycarbonate under compressive stress. The values obtained have bee

Spatially resolved X-ray diffraction as
✍ A. Wierzbicka; J. Z. Domagala; M. Sarzynski; Z. R. Zytkiewicz πŸ“‚ Article πŸ“… 2009 πŸ› John Wiley and Sons 🌐 English βš– 667 KB

## Abstract Spatially resolved X‐ray diffraction (SRXRD) is applied for micro‐imaging of strain in laterally modulated epitaxial structures. In GaAs layers grown by liquid phase epitaxial lateral overgrowth (ELO) on SiO~2~‐masked GaAs substrates a downward tilt of ELO wings caused by their interact