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A Guarded Fragment for Abstract State Machines

โœ Scribed by Antje Nowack


Book ID
106389636
Publisher
Springer Netherlands
Year
2005
Tongue
English
Weight
1021 KB
Volume
14
Category
Article
ISSN
0925-8531

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๐Ÿ“œ SIMILAR VOLUMES


A test methodology for finite state mach
โœ Hyoung B. Min; William A. Rogers ๐Ÿ“‚ Article ๐Ÿ“… 1992 ๐Ÿ› Springer US ๐ŸŒ English โš– 876 KB

This paper presents an efficient automatic test pattern generation technique for loop-free circuits. A partial scan technique is used to convert a sequential circuit (finite state machine) with arbitrary feedback paths into a pipelined circuit for testing. Test generation for these modified circuits