A Fully Three-Dimensional Atomistic Quantum Mechanical Study on Random Dopant-Induced Effects in 25-nm MOSFETs

✍ Scribed by Xiang-Wei Jiang; Hui-Xiong Deng; Jun-Wei Luo; Shu-Shen Li; Lin-Wang Wang

• Book ID: 114619455
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 619 KB
• Volume: 55
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2008.925331