A framework for assessing amorphous oxide semiconductor thin-film transistor passivation

✍ Scribed by Wager, John F.; Hoshino, Ken; Sundholm, Eric S.; Presley, Rick E.; Ravichandran, Ram; Knutson, Christopher C.; Keszler, Douglas A.; Hoffman, Randy L.; Mourey, Devin A.; Robertson, John

• Book ID: 118763393
• Publisher: Society for Information Display
• Year: 2012
• Tongue: English
• Weight: 265 KB
• Volume: 20
• Category: Article
• ISSN: 1071-0922
• DOI: 10.1002/jsid.120