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A fast algorithm for the calculation of junction capacitance and its application for impurity profile determination

โœ Scribed by H.J.J. De Man

Publisher
Elsevier Science
Year
1972
Tongue
English
Weight
769 KB
Volume
15
Category
Article
ISSN
0038-1101

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## Abstract A simple, robust, accurate method to extract the thermal resistance of BJT/HBT devices is proposed, which only needs the measured device DC Iโ€V characteristics at room temperature. No optimization is needed to extract the thermal resistance. The proposed method is verified using a varie