A fast and practical approach to the determination of junction temperature and thermal resistance for BJT/HBT devices
✍ Scribed by Ban Leong Ooi; Bo Chen; Fujiang Lin; Pang Shyan Kooi; Chi So Hui
- Publisher
- John Wiley and Sons
- Year
- 2002
- Tongue
- English
- Weight
- 127 KB
- Volume
- 35
- Category
- Article
- ISSN
- 0895-2477
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✦ Synopsis
Abstract
A simple, robust, accurate method to extract the thermal resistance of BJT/HBT devices is proposed, which only needs the measured device DC I‐V characteristics at room temperature. No optimization is needed to extract the thermal resistance. The proposed method is verified using a variety of BJT/HBT devices. Compared to the measured results taken from both CW DC measurements and isothermal measurements, the extracted values using our method is in excellent agreement with the conventional method. © 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 35: 499–502, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10648