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A facile method for the density determination of ceramic thin films using X-ray reflectivity

✍ Scribed by Veldhuis, Sjoerd A.; Brinks, Peter; Stawski, Tomasz M.; Göbel, Ole F.; ten Elshof, Johan E.


Book ID
125365068
Publisher
Springer
Year
2014
Tongue
English
Weight
1006 KB
Volume
71
Category
Article
ISSN
0928-0707

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