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A dynamic model for solder and the problem of accelerated life testing

✍ Scribed by Stan Russell; Anne Grigals; Ed Clemente

Book ID
107457982
Publisher
Springer US
Year
1999
Tongue
English
Weight
513 KB
Volume
28
Category
Article
ISSN
0361-5235

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✍ Huan-Jyh Shyur; E. A. Elsayed; James T. LuxhΓΈj πŸ“‚ Article πŸ“… 1999 πŸ› John Wiley and Sons 🌐 English βš– 171 KB πŸ‘ 2 views

This paper introduces a general or "distribution-free" model to analyze the lifetime of components under accelerated life testing. Unlike the accelerated failure time (AFT) models, the proposed model shares the advantage of being "distribution-free" with the proportional hazard (PH) model and overco