A double-word-line structure in bipolar ECL random access memory: S Kayano, K Anami, Y Nakase, T Shiomi, T Ikeda (Mitsubishi Electr. Corp., Hyogo, Japan) IEEE J. Solid-State Circuits (USA) vol. SC-22, no. 4, pp. 543–547 (Aug. 1987)

• Book ID: 104157730
• Publisher: Elsevier Science
• Year: 1988
• Tongue: English
• Weight: 95 KB
• Volume: 19
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/s0026-2692(88)80198-8