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A directed search method for test generation using a concurrent simulator

✍ Scribed by Agrawal, V.D.; Kwang-Ting Cheng; Agrawal, P.

Book ID: 119777658
Publisher: IEEE
Year: 1989
Tongue: English
Weight: 852 KB
Volume: 8
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.21831

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