A direct depletion capacitance measurement technique to determine the doping profile under the gate of a MOSFET

✍ Scribed by Wikstrom, J.A.; Viswanathan, C.R.

• Book ID: 114596108
• Publisher: IEEE
• Year: 1987
• Tongue: English
• Weight: 285 KB
• Volume: 34
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1987.23221