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A device for measuring optical density of wide-format x-ray films

✍ Scribed by V. A. Mikhailov; M. G. Ennenberg

Publisher: Springer US
Year: 1980
Tongue: English
Weight: 342 KB
Volume: 14
Category: Article
ISSN: 0006-3398
DOI: 10.1007/bf00557453

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