A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time, as well as for the future. This book
A Designerβs Guide to Built-In Self-Test
β Scribed by Charles E. Stroud (auth.)
- Publisher
- Springer US
- Year
- 2002
- Tongue
- English
- Leaves
- 340
- Series
- Frontiers in Electronic Testing 19
- Edition
- 1
- Category
- Library
No coin nor oath required. For personal study only.
β¦ Subjects
Circuits and Systems; Electronic and Computer Engineering; Computer-Aided Engineering (CAD, CAE) and Design
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