A Designer s Guide to Built-in Self-Test

✍ Scribed by Charles E. Stroud

• Publisher: Springer
• Year: 2002
• Tongue: English
• Leaves: 338
• Series: Frontiers in Electronic Testing
• Edition: 1
• Category: Library

✦ Synopsis

A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time, as well as for the future. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. The BIST approaches include the Built-In Logic Block Observer, pseudo-exhaustive BIST techniques, Circular BIST, scan-based BIST, BIST for regular structures, BIST for FPGAs and CPLDs, mixed-signal BIST, and the integration of BIST with concurrent fault detection techniques for on-line testing. Particular attention is paid to system-level use of BIST in order to maximize the benefits of BIST through reduced testing time and cost as well as high diagnostic resolution. The author spent 15 years as a designer at Bell Labs where he designed over 20 production VLSI devices and 3 production circuit boards. Sixteen of the VLSI devices contained BIST of various types for regular structures and general sequential logic, including the first BIST for Random Access Memories (RAMs), the first completely self-testing integrated circuit, and the first BIST for mixed-signal systems at Bell Labs. He has spent the past 10 years in academia where his research and development continues to focus on BIST, including the first BIST for FPGAs and CPLDs along with continued work in the area of BIST for general sequential logic and mixed-signal systems. He holds 10 US patents (with 5 more pending) for various types of BIST approaches. Therefore, the author brings a unique blend of knowledge and experience to this practical guide for designers, test engineers, product engineers, system diagnosticians, and managers.

✦ Table of Contents

A Designer's Guide to Built-in Self-Test......Page 1
Table of Contents......Page 6
Preface......Page 12
About the Author......Page 16
About the Cover......Page 19
CHAPTER 1 An Overview of BIST......Page 20
CHAPTER 2 Fault Models, Detection, and Simulation......Page 34
CHAPTER 3 Design for Testability......Page 62
CHAPTER 4 Test Pattern Generation......Page 80
CHAPTER 5 Output Response Analysis......Page 100
CHAPTER 6 Manufacturing and System-Level Use of BIST......Page 120
CHAPTER 7 Built-In Logic Block Observer......Page 140
CHAPTER 8 Pseudo-Exhaustive BIST......Page 156
CHAPTER 9 Circular BIST......Page 168
CHAPTER 10 Scan-Based BIST......Page 188
CHAPTER 11 Non-Intrusive BIST......Page 210
CHAPTER 12 BIST for Regular Structures......Page 226
CHAPTER 13 BIST for FPGAs and CPLDs......Page 240
CHAPTER 14 Applying Digital BIST to Mixed-Signal Systems......Page 270
CHAPTER 15 Merging BIST and Concurrent Fault Detection......Page 286
Acronyms......Page 306
Bibliography......Page 310
Index......Page 332