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A Design of Linearity Built-in Self-Test for Current-Steering DAC

โœ Scribed by Hsin-Wen Ting; Soon-Jyh Chang; Su-Ling Huang

Book ID
106384510
Publisher
Springer US
Year
2010
Tongue
English
Weight
902 KB
Volume
27
Category
Article
ISSN
0923-8174

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## Abstract Recently current testing is beginning to be noticed as a testing method for CMOS circuits. However, since CMOS circuits cause the dynamic current due to switching, it has been pointed out that testing at a fast clock rate by current testing is difficult. To cope with this problem a buil