A deep level transient spectroscopy study on the interface states across grain boundaries in multicrystalline silicon

✍ Scribed by J. Chen; E. Cornagliotti; E. Simoen; E. Hieckmann; J. Weber; J. Poortmans

• Book ID: 112183211
• Publisher: John Wiley and Sons
• Year: 2011
• Tongue: English
• Weight: 263 KB
• Volume: 5
• Category: Article
• ISSN: 1862-6254
• DOI: 10.1002/pssr.201105225