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A DE-embedding technique for reflection-based S-parameter measurements of HMICs and MMICs

✍ Scribed by F. M. Ghannouchi; F. Beauregard; R. Hajji; A. Brodeur

Book ID: 112146777
Publisher: John Wiley and Sons
Year: 1995
Tongue: English
Weight: 523 KB
Volume: 10
Category: Article
ISSN: 0895-2477
DOI: 10.1002/mop.4650100408

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