A Data Base Driven Automated System for MOS Device Characterization, Parameter Optimization and Modeling

✍ Scribed by Melstrand, O.; O'Neill, E.; Sobelman, G.E.; Dokos, D.

• Book ID: 118698147
• Publisher: IEEE
• Year: 1984
• Tongue: English
• Weight: 708 KB
• Volume: 3
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/tcad.1984.1270056