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A Correlated Diffusion Noise Model for the Field-Effect Transistor

✍ Scribed by Sungjae Lee; Webb, K.J.

Book ID: 117907895
Publisher: IEEE
Year: 2007
Tongue: English
Weight: 658 KB
Volume: 26
Category: Article
ISSN: 0278-0070
DOI: 10.1109/tcad.2007.895770

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